Conductive atomic force microscopy investigations of quantum dots and quantum ringsMlakar, Tomaž (Avtor)
Heun, Stefan (Mentor)
kvantne pikekvantni obročimikroskop na atomsko silomodeliranje prevodnostimetoda prenosnih matrikmagistrske nalogeT. Mlakar20112013-10-15 12:45:48Magistrsko delo1044COBISS_ID: 2043131UDK: 538.9NUK URN: URN:SI:UNG:REP:NNNZGBGSsl