Spectroscopic Photo-IV Diagnostics of Nitride-based HEMT on Si WafersTong, Fei (Avtor)
Yapabandara, Kosala (Avtor)
Yang, Chunwei (Avtor)
Khanal, Min (Avtor)
Jiao, Chunkun (Avtor)
Goforth, M (Avtor)
Burcu, Ozden (Avtor)
Ahyi, Ayayi (Avtor)
Hamilton, Michael (Avtor)
Niu, Guofu (Avtor)
Ewoldt, D.A. (Avtor)
Chung, G (Avtor)
Park, Minseo (Avtor)
Spectroscopic Photo-IVAlGaN/GaN HEMT20132017-01-13 15:17:56Delo ni kategorizirano2899COBISS_ID: 4637691DOI: 10.1049/el.2013.3404NUK URN: URN:SI:UNG:REP:TW1F9GXNsl