Spectroscopic Photo-IV Diagnostics of Nitride-based HEMT on Si Wafers
2013
2017-01-13 15:17:56
1033
Spectroscopic Photo-IV, AlGaN/GaN HEMT
r6
Fei
Tong
70
Kosala
Yapabandara
70
Chunwei
Yang
70
Min
Khanal
70
Chunkun
Jiao
70
M
Goforth
70
Ozden
Burcu
70
Ayayi
Ahyi
70
Michael
Hamilton
70
Guofu
Niu
70
D.A.
Ewoldt
70
G
Chung
70
Minseo
Park
70
COBISS_ID
3
4637691
DOI
15
10.1049/el.2013.3404
NUK URN
18
URN:SI:UNG:REP:TW1F9GXN
photo_iv.pdf
183510
Predstavitvena datoteka
2017-01-13 15:18:14