Scanning Photoelectron Spectro‐Microscopy: A Modern Tool for the Study of Materials at the Nanoscale
2018
2018-12-07 03:34:46
1033
Scanning photoemission microscopy, graphene, GaAs, nanowires, Fermi Level, Mott-Hubbard transition
r6
Patrick
Zeller
70
Matteo
Amati
70
Hikmet
Sezen
70
Mattia
Scardamaglia
70
Claudia
Struzzi
70
Carla
Bittencourt
70
Gabriel
Lantz
70
Mahdi
Hajlaoui
70
Evangelos
Papalazarou
70
Marino
Marsi
70
Mattia
Fanetti
70
Stefano
Ambrosini
70
Silvia
Rubini
70
Luca
Gregoratti
70
COBISS_ID
3
5279483
DOI
15
10.1002/pssa.201800308
NUK URN
18
URN:SI:UNG:REP:NKGS7OVA
Zeller_SPEM_PhysStatSolA_18.pdf
1171969
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Izvorni URL
2018-12-07 03:34:47