High resolution beam profiling of X-ray free electron laser radiation by polymer imprint developmentRösner, Benedikt (Avtor)
Döring, Florian (Avtor)
Rebernik Ribič, Primož (Avtor)
Gauthier, David (Avtor)
Principi, Emiliano (Avtor)
Masciovecchio, Claudio (Avtor)
Zangrando, Marco (Avtor)
Vila-Comamala, Joan (Avtor)
De Ninno, Giovanni (Avtor)
David, Christian (Avtor)
free-electron lasersmetrologypolymersX-ray optics20172020-01-13 20:07:04Delo ni kategorizirano4964COBISS_ID: 5537531UDK: 53ISSN pri članku: 1094-4087DOI: 10.1364/OE.25.030686NUK URN: URN:SI:UNG:REP:GD14WOVTsl