High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development
2017
2020-01-13 20:07:04
1033
free-electron lasers, metrology, polymers, X-ray optics
r6
Benedikt
Rösner
70
Florian
Döring
70
Primož
Rebernik Ribič
70
David
Gauthier
70
Emiliano
Principi
70
Claudio
Masciovecchio
70
Marco
Zangrando
70
Joan
Vila-Comamala
70
Giovanni
De Ninno
70
Christian
David
70
COBISS_ID
3
5537531
UDK
4
53
ISSN pri članku
9
1094-4087
DOI
15
10.1364/OE.25.030686
NUK URN
18
URN:SI:UNG:REP:GD14WOVT
RAZ_Rosner_Benedikt_i2017.pdf
3527369
Predstavitvena datoteka
2020-01-13 20:07:54