20.500.12556/RUNG-4964-a44c54ed-fc2f-c8c7-8186-65a8120bf42b
High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development
free-electron lasers
metrology
polymers
X-ray optics
true
true
false
Angleški jezik
Ni določen
Delo ni kategorizirano
2020-01-13 20:07:04
2020-01-13 20:08:24
2023-06-09 03:35:46
0000-00-00 00:00:00
2017
0
0
str. 30686-30695
no. 24
Vol. 25
Nov. 2017
0000-00-00
NiDoloceno
NiDoloceno
NiDoloceno
0000-00-00
0000-00-00
0000-00-00
5537531
53
1094-4087
10.1364/OE.25.030686
URN:SI:UNG:REP:GD14WOVT
Univerza v Novi Gorici
0
0
0