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Found in: osebi
Keywords: fotokataliza, kompoziti, nanodelci, UV svetloba, vidna svetloba
Published: 25.04.2014; Views: 3466; Downloads: 22
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Abstract: Narvika Bovcon, Aleš Vaupotič, v sodelovanju z: Saim Emin (priprava vzorcev), Mattia Fanetti (operater vrstičnega elektronskega mikroskopa). Digitalna grafika, steklo, okvir, dimenzije: 136 × 136 cm, črno-belo. 2014. Produkcija: Univerza v Novi Gorici, projekt SUNGREEN.
Found in: osebi
Summary of found: ...Bovcon, Aleš Vaupotič, v sodelovanju z: Saim Emin (priprava vzorcev), Mattia Fanetti (operater vrstičnega elektronskega...
Keywords: tehniška slika, novomedijska umetnost, materiali, mikroskopija, vrstični elektronski mikroskop, SEM
Published: 12.05.2016; Views: 2635; Downloads: 12

Abstract: Narvika Bovcon, Aleš Vaupotič, v sodelovanju z: Saim Emin (priprava vzorcev), Mattia Fanetti (operater vrstičnega elektronskega mikroskopa). Digitalna grafika, steklo, okvir, dimenzije: 65 × 56 cm (ležeče), črno-belo. 2014. Produkcija: Univerza v Novi Gorici, projekt SUNGREEN.
Found in: osebi
Summary of found: ...Bovcon, Aleš Vaupotič, v sodelovanju z: Saim Emin (priprava vzorcev), Mattia Fanetti (operater vrstičnega elektronskega...
Keywords: tehniška slika, novomedijska umetnost, materiali, mikroskopija, vrstični elektronski mikroskop, SEM
Published: 12.05.2016; Views: 2150; Downloads: 12

Abstract: Narvika Bovcon, Aleš Vaupotič, v sodelovanju z: Saim Emin (priprava vzorcev), Mattia Fanetti (operater vrstičnega elektronskega mikroskopa). Digitalna grafika, steklo, okvir, dimenzije: 65 × 56 cm (ležeče), črno-belo. 2014. Produkcija: Univerza v Novi Gorici, projekt SUNGREEN.
Found in: osebi
Summary of found: ...Bovcon, Aleš Vaupotič, v sodelovanju z: Saim Emin (priprava vzorcev), Mattia Fanetti (operater vrstičnega elektronskega...
Keywords: tehniška slika, novomedijska umetnost, materiali, mikroskopija, vrstični elektronski mikroskop, SEM
Published: 12.05.2016; Views: 2122; Downloads: 11

Abstract: We have studied submonolayer coverages of N,N-1H,1H-perfluorobutyl dicyanoperylenecarboxydiimide (PDIF-CN2) on mechanically exfoliated graphene transferred onto SiO2 substrates. Our atomic force microscopy (AFM) data show that PDIF-CN2 forms irregularly-shaped 1.4 nm-high islands. From the selected area diffraction performed with transmission electron microscope (TEM) we conclude that this height corresponds to π−π stacks of molecules, which are inclined for 43° relative to the graphene surface. AFM also showed complete absence of PDIF-CN2 on single-layer graphene (SLG). Electric force microscopy revealed a marked difference in surface charge density between a single-layer graphene and bilayer graphene, with a higher surface charge on SLG than on the bilayer graphene. We associate this behavior with p− type doping of graphene due to the electrostatic dipole induced by the molecular water layer present at the graphene/SiO2 interface. The crucial role of the graphene/SiO2 interface in determining growth of PDIF-CN2 was further confirmed by TEM examination of PDIF-CN2 deposited onto unsupported SLG.
Found in: osebi
Keywords: afm, organic semiconductors, graphene
Published: 18.05.2017; Views: 2218; Downloads: 0
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