| Title: | Spectroscopic Photo-IV Diagnostics of Nitride-based HEMT on Si Wafers |
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| Authors: | Tong, Fei (Author)
Yapabandara, Kosala (Author)
Yang, Chunwei (Author)
Khanal, Min (Author)
Jiao, Chunkun (Author)
Goforth, M (Author)
Burcu, Ozden (Author)
Ahyi, Ayayi (Author)
Hamilton, Michael (Author)
Niu, Guofu (Author)
Ewoldt, D.A. (Author)
Chung, G (Author)
Park, Minseo (Author) |
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| Files: | This document has no files. This document may have a phisical copy in the library of the organization, check the status via COBISS.  |
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| Language: | English |
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| Work type: | Not categorized (r6) |
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| Tipology: | 1.01 - Original Scientific Article |
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| Organization: | UNG - University of Nova Gorica |
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| Keywords: | Spectroscopic Photo-IV, AlGaN/GaN HEMT |
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| Year of publishing: | 2013 |
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| Number of pages: | 1547-1548 |
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| Numbering: | 49, 24 |
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| COBISS_ID: | 4637691 |
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| URN: | URN:SI:UNG:REP:TW1F9GXN |
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| DOI: | 10.1049/el.2013.3404 |
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| Views: | 3178 |
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| Downloads: | 0 |
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| Metadata: |     |
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| Categories: | Document is not linked to any category. |
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