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Title:Spectroscopic Photo-IV Diagnostics of Nitride-based HEMT on Si Wafers
Authors:Tong, Fei (Author)
Yapabandara, Kosala (Author)
Yang, Chunwei (Author)
Khanal, Min (Author)
Jiao, Chunkun (Author)
Goforth, M (Author)
Burcu, Ozden (Author)
Ahyi, Ayayi (Author)
Hamilton, Michael (Author)
Niu, Guofu (Author)
Ewoldt, D.A. (Author)
Chung, G (Author)
Park, Minseo (Author)
Files:This document has no files. This document may have a phisical copy in the library of the organization, check the status via COBISS. Link is opened in a new window
Language:English
Work type:Not categorized (r6)
Tipology:1.01 - Original Scientific Article
Organization:UNG - University of Nova Gorica
Keywords:Spectroscopic Photo-IV, AlGaN/GaN HEMT
Year of publishing:2013
Number of pages:1547-1548
Numbering:49, 24
COBISS_ID:4637691 Link is opened in a new window
URN:URN:SI:UNG:REP:TW1F9GXN
DOI:10.1049/el.2013.3404 Link is opened in a new window
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Record is a part of a journal

Title:Electronics Letters
Publisher:Institution of Engineering and Technology (IET)
ISSN:0013-5194
Year of publishing:2013

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