ROSNER, Benedikt, DÖRING, Florian, REBERNIK RIBIČ, Primož, GAUTHIER, David, PRINCIPI, Emiliano, MASCIOVECCHIO, Claudio, ZANGRANDO, Marco, VILA-COMAMALA, Joan, DE NINNO, Giovanni in DAVID, Christian, 2017, High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development. Optics express [na spletu]. 2017. Vol. 25, no. 24, p. 30686–30695. [Dostopano 7 april 2025]. DOI 10.1364/OE.25.030686. Pridobljeno s: https://repozitorij.ung.si/IzpisGradiva.php?lang=slv&id=4964