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1. High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development Benedikt Rosner, Florian Döring, Primož Rebernik Ribič, David Gauthier, Emiliano Principi, Claudio Masciovecchio, Marco Zangrando, Joan Vila-Comamala, Giovanni De Ninno, Christian David, 2017, original scientific article Keywords: free-electron lasers, metrology, polymers, X-ray optics Published in RUNG: 13.01.2020; Views: 3997; Downloads: 0

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