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1. Depth-resolved ultra-violet spectroscopic photo current-voltage measurements for the analysis of AlGaN/GaN high electron mobility transistor epilayer deposited on Si Burcu Ozden, Chungman Yang, Fei Tong, Min Khanal, Vahid Mirkhani, Mobbassar Hassan Sk, Ayayi Ahyi, Minseo Park, 2014, original scientific article Keywords: AlGaN/GaN high electron mobility transistor, Depth-resolved ultra-violet spectroscopic photo current-voltage measurement Published in RUNG: 16.01.2017; Views: 5526; Downloads: 0 This document has many files! More...

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