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1. Depth-resolved ultra-violet spectroscopic photo current-voltage measurements for the analysis of AlGaN/GaN high electron mobility transistor epilayer deposited on Si Burcu Ozden, Chungman Yang, Fei Tong, Min Khanal, Vahid Mirkhani, Mobbassar Hassan Sk, Ayayi Ahyi, Minseo Park, 2014, original scientific article Found in: ključnih besedah Keywords: AlGaN/GaN high electron mobility transistor, Depth-resolved ultra-violet spectroscopic photo current-voltage measurement Published: 16.01.2017; Views: 3861; Downloads: 0 Fulltext (862,92 KB)

2. Spectroscopic Photo-IV Diagnostics of Nitride-based HEMT on Si Wafers D.A. Ewoldt, Guofu Niu, Michael Hamilton, Ayayi Ahyi, Ozden Burcu, M Goforth, Chunkun Jiao, Min Khanal, Chunwei Yang, Kosala Yapabandara, Fei Tong, G Chung, Minseo Park, 2013, original scientific article Found in: ključnih besedah Keywords: Spectroscopic Photo-IV, AlGaN/GaN HEMT Published: 16.01.2017; Views: 3613; Downloads: 0 Fulltext (179,21 KB)

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