Repozitorij Univerze v Novi Gorici

Iskanje po repozitoriju
A+ | A- | Pomoč | SLO | ENG

Iskalni niz: išči po
išči po
išči po
išči po
* po starem in bolonjskem študiju

Opcije:
  Ponastavi


1 - 3 / 3
Na začetekNa prejšnjo stran1Na naslednjo stranNa konec
1.
Surface roughness and wetting properties of plastic pipes : Proof-of-concept experiment report
Andraž Mavrič, Mattia Fanetti, Simone Dal Zilio, 2022, končno poročilo o rezultatih raziskav

Ključne besede: surface roughness, wetting
Objavljeno v RUNG: 21.03.2023; Ogledov: 1181; Prenosov: 0
Gradivo ima več datotek! Več...

2.
Nondestructive Evaluation of Surface Roughness of Thin Films through Fractal Analysis, S Soumya
Mohanachandran Nair Sindhu Swapna, 2017, izvirni znanstveni članek

Ključne besede: Nondestructive Evaluation, Surface Roughness, Thin Films, Fractal Analysis
Objavljeno v RUNG: 05.07.2022; Ogledov: 1411; Prenosov: 0
Gradivo ima več datotek! Več...

3.
Fractal and inertia moment analyses for thin film quality monitoring
Mohanachandran Nair Sindhu Swapna, 2022, izvirni znanstveni članek

Opis: The widespread applications of thin films in optronics demand innovative techniques for its characterizations. The work reported here proposes electronic speckle pattern interferometry and fractal-based methods for assessing the quality of thin films taking the industrially relevant molybdenum oxide (MoO3) incorporated niobium oxide (Nb2O5) films. The films with different levels of MoO3 incorporation (1, 2, 3, 5, and 10 wt. %) are prepared by radio frequency sputtering. The study reveals the structure modifications of Nb2O5 from the orthorhombic to monoclinic phases with an associated morphological variation revealed through atomic force microscopy and field-emission scanning electron microscopy analyses. The films’ specklegrams are recorded under thermal stress; the inertia moment (IM) and fractal analyses are computed and compared with the root-mean-square surface roughness of the films. The lacunarity analysis of the AFM films agrees well with the specklegrams. Thus, the lower IM and lacunarity values of the specklegrams can be regarded as indicators of the good quality of thin films.
Ključne besede: cross-correlation, fractal dimension, inertia moment, lacunarity, speckle, surface roughness.
Objavljeno v RUNG: 30.06.2022; Ogledov: 1482; Prenosov: 0
Gradivo ima več datotek! Več...

Iskanje izvedeno v 0.02 sek.
Na vrh