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1. Depth-resolved ultra-violet spectroscopic photo current-voltage measurements for the analysis of AlGaN/GaN high electron mobility transistor epilayer deposited on Si Burcu Ozden, Chungman Yang, Fei Tong, Min Khanal, Vahid Mirkhani, Mobbassar Hassan Sk, Ayayi Ahyi, Minseo Park, 2014, original scientific article Found in: osebi Keywords: AlGaN/GaN high electron mobility transistor, Depth-resolved ultra-violet spectroscopic photo current-voltage measurement Published: 16.01.2017; Views: 3737; Downloads: 0 Fulltext (862,92 KB)

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