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1.
Hidden periodicity in Stripe 82 with Saraswati supercluster—a fractal analysis
Vimal Raj, Mohanachandran Nair Sindhu Swapna, Sankaranarayana Iyer Sankararaman, 2021, original scientific article

Abstract: The manuscript attempts to explore the periodicity in the distribution of galaxies in the recently reported Saraswati supercluster and the Stripe 82 region containing it as an example. The report of 120 Mpc periodicity in the Abell galaxy clusters by power spectrum analysis is the motivation behind the study. The power spectral analysis across the central part of the Stripe 82 region shows a periodic variation of 3.09° or 71 Mpc in fractal dimension whereas an average angular periodicity of 3.45° or 94 Mpc is observed across the Stripe 82 region. This refers to the periodicity of complexity or cluster density of galaxy distribution. The texture of the distribution pattern understood through lacunarity analysis indicates a near symmetric distribution. Fractal dimensions like box-counting dimension, information dimension and correlation dimension are also found through multifractal analysis. While the information dimension tells about the distribution density of galactic points, the correlation dimension details the distribution of galaxies in the neighbourhood
Keywords: galaxy distribution, fractal analysis, multifractals, lacunarity, Saraswati supercluster, Stripe 82
Published in RUNG: 04.07.2022; Views: 1122; Downloads: 0
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2.
Fractal and inertia moment analyses for thin film quality monitoring
Mohanachandran Nair Sindhu Swapna, 2022, original scientific article

Abstract: The widespread applications of thin films in optronics demand innovative techniques for its characterizations. The work reported here proposes electronic speckle pattern interferometry and fractal-based methods for assessing the quality of thin films taking the industrially relevant molybdenum oxide (MoO3) incorporated niobium oxide (Nb2O5) films. The films with different levels of MoO3 incorporation (1, 2, 3, 5, and 10 wt. %) are prepared by radio frequency sputtering. The study reveals the structure modifications of Nb2O5 from the orthorhombic to monoclinic phases with an associated morphological variation revealed through atomic force microscopy and field-emission scanning electron microscopy analyses. The films’ specklegrams are recorded under thermal stress; the inertia moment (IM) and fractal analyses are computed and compared with the root-mean-square surface roughness of the films. The lacunarity analysis of the AFM films agrees well with the specklegrams. Thus, the lower IM and lacunarity values of the specklegrams can be regarded as indicators of the good quality of thin films.
Keywords: cross-correlation, fractal dimension, inertia moment, lacunarity, speckle, surface roughness.
Published in RUNG: 30.06.2022; Views: 1168; Downloads: 0
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