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Title:Optimizacija optičnega nadzora naprave za površinsko montažo elektronskih komponent
Authors:ID Zavrtanik, Marko (Mentor) More about this mentor... New window
ID Torroni, Andrea (Author)
Files:.pdf Andrea_Torroni.pdf (1,75 MB)
MD5: AC11EB86F7FDC538B10878F1A56B0B5D
 
Language:Slovenian
Work type:Bachelor thesis/paper
Typology:2.11 - Undergraduate Thesis
Organization:PTF - Faculty of Engineering and Management
Abstract:Namen diplomskega dela je odpravljanje napak na liniji za površinsko montažo elektronskih komponent (SMD). Delo na tej liniji je pokazalo, da so na izdelkih prisotne napake. Te zaradi problematičnega reševanja nepravilnosti zaustavljajo celotni proizvodni proces, za odpravljanje pa se porabi veliko časa. Proces ni več popolnoma avtomatski, kot se za to linijo zahteva. Težave nastajajo predvsem zaradi velikega števila težko predvidljivih vzrokov, ki povzročajo napake. Te lahko nastajajo na vseh napravah linije, glede na nastanek pa jih lahko zberemo v skupine. S pomočjo nekaterih izdelkov bomo analizirali vse najpogostejše napake. Raziskali bomo realne vzroke za nepravilnosti na vseh napravah na liniji in opisali rešitve za nastale težave. Te bomo z lastnimi izkušnjami tudi utemeljili. S tem delom si bodo lahko operaterji in drugi, ki jih zanima delo na tej liniji, pomagali pri reševanju napak. Opisi reševanja napak naj bi operaterje vodili k hitremu in trajnemu odpravljanju napak. Ocenili bomo, kolikšne so časovne izgube zaradi nepravilnosti oziroma kolikšen delež časovne optimizacije lahko dosežemo z odpravljanjem določenega števila napak. Cilj je doseči vsaj 5-% časovno izboljšavo na celotni proizvodnji elektronskih vezij. To bo za podjetje pomenilo znaten prihranek. Delo bo prineslo tudi nova zavedanja o pomembnosti odpravljanja napak na liniji.
Keywords:elektronika, površinska montaža elementov, avtomatska optična inšpekcija, napake, izboljšave
Place of publishing:Nova Gorica
Year of publishing:2015
PID:20.500.12556/RUNG-1990 New window
COBISS.SI-ID:4049147 New window
NUK URN:URN:SI:UNG:REP:AMQ8KW7P
Publication date in RUNG:05.10.2015
Views:7546
Downloads:295
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Secondary language

Language:English
Title:Optimizing the optical control on SMD line devices
Abstract:The thesis has as a purpose the optimization and the debugging of SMD line. Working on this line has shown that there are some defects on the products. Errors block the entire production process for problem solving and require time and operators' work to deal with them. The process isn't fully automatic anymore, as required for this line. The problems are mainly due to the large number of causes of errors, that are difficult to predict. Errors can occur on all devices on the line. According to the fault we can collect problems in groups. A lot of time and strength is wasted because of this problem. With the help of some products we will analyze all the most common mistakes. We will investigate the real causes of the irregularities on all devices on the line and provide solutions to solve problems. We will use our own experience to justify that. This work will help operators and others who are interested in working on this line, in order to assist them when solving defects. Description of how to solve such problems will guide the operators to a rapid and lasting correction of errors. We will evaluate to what extent irregularities cause a waste of time and what percentage of time optimization can be achieved by eliminating a certain number of errors. The aim is to achieve at least a 5-% in time improvement within the entire production of electronic circuits. That will mean significant savings for the company. This work will bring new awareness of the importance of eliminating defects on the line.
Keywords:electronics, surface mount technology, automated optical inspection, defects, improvements


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