Repozitorij Univerze v Novi Gorici

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Naslov:Fractal and inertia moment analyses for thin film quality monitoring
Avtorji:ID Swapna, Mohanachandran Nair Sindhu, UNIVERSITY OF KERALA (Avtor)
Datoteke: Gradivo nima datotek, ki so prostodostopne za javnost. Gradivo je morda fizično dosegljivo v knjižnici fakultete, zalogo lahko preverite v COBISS-u. Povezava se odpre v novem oknu
Jezik:Angleški jezik
Vrsta gradiva:Delo ni kategorizirano
Tipologija:1.01 - Izvirni znanstveni članek
Organizacija:UNG - Univerza v Novi Gorici
Opis:The widespread applications of thin films in optronics demand innovative techniques for its characterizations. The work reported here proposes electronic speckle pattern interferometry and fractal-based methods for assessing the quality of thin films taking the industrially relevant molybdenum oxide (MoO3) incorporated niobium oxide (Nb2O5) films. The films with different levels of MoO3 incorporation (1, 2, 3, 5, and 10 wt. %) are prepared by radio frequency sputtering. The study reveals the structure modifications of Nb2O5 from the orthorhombic to monoclinic phases with an associated morphological variation revealed through atomic force microscopy and field-emission scanning electron microscopy analyses. The films’ specklegrams are recorded under thermal stress; the inertia moment (IM) and fractal analyses are computed and compared with the root-mean-square surface roughness of the films. The lacunarity analysis of the AFM films agrees well with the specklegrams. Thus, the lower IM and lacunarity values of the specklegrams can be regarded as indicators of the good quality of thin films.
Ključne besede:cross-correlation, fractal dimension, inertia moment, lacunarity, speckle, surface roughness.
Verzija publikacije:Objavljena publikacija
Leto izida:2022
Št. strani:15
Številčenje:4, 61
PID:20.500.12556/RUNG-7442 Novo okno
COBISS.SI-ID:113431555 Novo okno
DOI:10.1117/1.OE.61.4.044106 Novo okno
NUK URN:URN:SI:UNG:REP:WEZFL1VV
Datum objave v RUNG:30.06.2022
Število ogledov:1516
Število prenosov:0
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Gradivo je del revije

Naslov:Optical Engineering
Leto izida:2022
ISSN:1560-2303

Licence

Licenca:CC BY-NC-ND 4.0, Creative Commons Priznanje avtorstva-Nekomercialno-Brez predelav 4.0 Mednarodna
Povezava:http://creativecommons.org/licenses/by-nc-nd/4.0/deed.sl
Opis:Najbolj omejujoča licenca Creative Commons. Uporabniki lahko prenesejo in delijo delo v nekomercialne namene in ga ne smejo uporabiti za nobene druge namene.
Začetek licenciranja:30.06.2022

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