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Naslov:Speckle interferometric investigation of argon pressure-induced surface roughness modifications in RF-sputtered MoO[sub]3 film
Avtorji:ID Soumya, S. (Avtor)
ID Kumar, R. Arun (Avtor)
ID Sreejyothi, S. (Avtor)
ID Raj, Vimal (Avtor)
ID Swapna, Mohanachandran Nair Sindhu (Avtor)
ID Iyer Sankararaman, Sankaranarayana (Avtor)
Datoteke: Gradivo nima datotek, ki so prostodostopne za javnost. Gradivo je morda fizično dosegljivo v knjižnici fakultete, zalogo lahko preverite v COBISS-u. Povezava se odpre v novem oknu
Jezik:Angleški jezik
Vrsta gradiva:Neznano
Tipologija:1.01 - Izvirni znanstveni članek
Organizacija:UNG - Univerza v Novi Gorici
Opis:Film quality analysis is of more considerable signifcance due to its diversifed applications in various felds of technology. The present work reports the speckle interferometric analysis of the argon pressure-induced surface roughness modifcations of RF sputtered MoO3 flms. The paper suggests a new method of surface quality analysis of thin flms through a parameter δ, which is the diference between the initial and fnal inertia moment values in the study of the thermal-induced dynamic speckle pattern. The limitations of root mean square surface roughness analysis of the atomic force microscopic image of the flms is also exemplifed. The research suggests that argon pressure plays a vital role in the surface property of RF sputtered flms and also that the dynamic speckle analysis can give precise information about the quality of flms. The contour plot of particle displacement vector under thermal stress, suggests the degree of uniformity in the distribution of particles in the flm.
Ključne besede:speckle pattern interferometry, time history of speckle pattern, cross correlation, inertia moment
Leto izida:2021
Št. strani:str. 1-9
Številčenje:Vol. 40, no. 1
PID:20.500.12556/RUNG-7466 Novo okno
COBISS.SI-ID:113770499 Novo okno
UDK:53
ISSN pri članku:0195-9298
DOI:10.1007/s10921-020-00741-x Novo okno
NUK URN:URN:SI:UNG:REP:PEIHZWAK
Datum objave v RUNG:04.07.2022
Število ogledov:2455
Število prenosov:0
Metapodatki:XML DC-XML DC-RDF
:
SOUMYA, S., KUMAR, R. Arun, SREEJYOTHI, S., RAJ, Vimal, SWAPNA, Mohanachandran Nair Sindhu in IYER SANKARARAMAN, Sankaranarayana, 2021, Speckle interferometric investigation of argon pressure-induced surface roughness modifications in RF-sputtered MoO[sub]3 film. Journal of nondestructive evaluation [na spletu]. 2021. Vol. 40, no. 1, p. 1–9. [Dostopano 18 april 2025]. DOI 10.1007/s10921-020-00741-x. Pridobljeno s: https://repozitorij.ung.si/IzpisGradiva.php?lang=slv&id=7466
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Naslov:Journal of nondestructive evaluation
Skrajšan naslov:J. nondestr. eval.
Založnik:Springer
ISSN:0195-9298
COBISS.SI-ID:512113689 Novo okno

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