SWAPNA, Mohanachandran Nair Sindhu, 2020, Criticality of depth of intensity modulation and simulation of refractive index profile in thermal lens technique. The European Physical Journal of Applied Physics [na spletu]. 2020. Vol. 1, no. 90. [Dostopano 23 april 2025]. DOI https://doi.org/10.1051/epjap/2020200024. Pridobljeno s: https://repozitorij.ung.si/IzpisGradiva.php?lang=slv&id=7487