| Title: | Spectroscopic Photo-IV Diagnostics of Nitride-based HEMT on Si Wafers |
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| Authors: | ID Tong, Fei, Department of Physics, Auburn University, Auburn, AL 36849, USA (Author)
ID Yapabandara, Kosala, Department of Physics, Auburn University, Auburn, AL 36849, USA (Author)
ID Yang, Chunwei, Department of Physics, Auburn University, Auburn, AL 36849, USA (Author)
ID Khanal, Min, Department of Physics, Auburn University, Auburn, AL 36849, USA (Author)
ID Jiao, Chunkun, Department of Physics, Auburn University, Auburn, AL 36849, USA (Author)
ID Goforth, M, Department of Physics, Auburn University, Auburn, AL 36849, USA (Author)
ID Burcu, Ozden, Department of Physics, Auburn University, Auburn, AL 36849, USA (Author)
ID Ahyi, Ayayi, Department of Physics, Auburn University, Auburn, AL 36849, USA (Author)
ID Hamilton, Michael, Department of Electrical and Computer Engineering, Auburn University, Auburn, AL 36849, USA (Author)
ID Niu, Guofu, Department of Electrical and Computer Engineering, Auburn University, Auburn, AL 36849, USA (Author)
ID Ewoldt, D.A., Dow Corning Compound Semiconductor Solutions, LLC, MI, USA (Author)
ID Chung, G, Dow Corning Compound Semiconductor Solutions, LLC, MI, USA (Author)
ID Park, Minseo, Department of Physics, Auburn University, Auburn, AL 36849, USA (Author) |
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| Files: |
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| Language: | English |
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| Work type: | Not categorized |
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| Typology: | 1.01 - Original Scientific Article |
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| Organization: | UNG - University of Nova Gorica
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| Keywords: | Spectroscopic Photo-IV, AlGaN/GaN HEMT |
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| Publication version: | Version of Record |
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| Year of publishing: | 2013 |
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| Number of pages: | 1547-1548 |
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| Numbering: | 24, 49 |
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| PID: | 20.500.12556/RUNG-2899-54df0517-8595-00ef-cfb1-e826b01c979d |
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| COBISS.SI-ID: | 4637691 |
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| DOI: | 10.1049/el.2013.3404 |
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| NUK URN: | URN:SI:UNG:REP:TW1F9GXN |
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| Publication date in RUNG: | 16.01.2017 |
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| Views: | 4269 |
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| Downloads: | 0 |
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