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Title: Fractal analysis as a potential tool for surface morphology of thin films Authors: ID Swapna, Mohanachandran Nair Sindhu, UNIVERSITY OF KERALA (Author), et al. Files: This document has no files that are freely available to the public. This document may have a physical copy in the library of the organization, check the status via COBISS.  Language: English Work type: Not categorized Typology: 1.01 - Original Scientific Article Organization: UNG - University of Nova Gorica Keywords: Fractals.thin film, AFM, surface morphology Year of publishing: 2017 Number of pages: 2017 Numbering: 12, 132 PID: 20.500.12556/RUNG-7483  COBISS.SI-ID: 113880067  DOI: 10.1140/epjp/i2017-11826-8  NUK URN: URN:SI:UNG:REP:8IDCRC1V Publication date in RUNG: 05.07.2022 Views: 1885 Downloads: 0 Metadata:    Cite this work Plain text BibTeX EndNote XML EndNote/Refer RIS ABNT ACM Ref AMA APA Chicago 17th Author-Date Harvard IEEE ISO 690 MLA Vancouver : Copy citation

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Record is a part of a journal

Title:	The European Physical Journal Plus
Year of publishing:	2017

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License:	CC BY-NC-ND 4.0, Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International
Link:	http://creativecommons.org/licenses/by-nc-nd/4.0/
Description:	The most restrictive Creative Commons license. This only allows people to download and share the work for no commercial gain and for no other purposes.
Licensing start date:	05.07.2022

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