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Title:Sample characterization by transverse photothermal beam deflection spectrometry in skimming configuration
Authors:ID Budasheva, Hanna (Author)
ID Swapna, Mohanachandran Nair Sindhu (Author)
ID Sankararaman, Sankaranarayana Iyer (Author)
ID Korte, Dorota (Author)
Files:URL https://pubs.aip.org/aip/jap/article-abstract/133/21/211101/2893856/Sample-characterization-by-transverse-photothermal?redirectedFrom=fulltext
 
Language:English
Work type:Unknown
Typology:1.02 - Review Article
Organization:UNG - University of Nova Gorica
Keywords:photothermal techniques, beam deflection spectrometry, material characterization
Publication date:01.06.2023
Year of publishing:2023
Number of pages:str. 1-24
Numbering:Vol. 133, issue 21, [article no.] 211101
PID:20.500.12556/RUNG-8258-ae8a23b6-da92-8d89-ccf6-e5591cb6cbce New window
COBISS.SI-ID:155461891 New window
UDC:54
ISSN on article:0021-8979
DOI:10.1063/5.0148079 New window
NUK URN:URN:SI:UNG:REP:HWOMUO20
Publication date in RUNG:13.06.2023
Views:920
Downloads:2
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Record is a part of a journal

Title:Journal of applied physics
Shortened title:J. appl. phys.
Publisher:American Institute of Physics.
ISSN:0021-8979
COBISS.SI-ID:4730378 New window

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