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Title: Sample characterization by transverse photothermal beam deflection spectrometry in skimming configuration Authors: ID Budasheva, Hanna (Author) ID Swapna, Mohanachandran Nair Sindhu (Author) ID Iyer Sankararaman, Sankaranarayana (Author) ID Korte, Dorota (Author) Files: https://pubs.aip.org/aip/jap/article-abstract/133/21/211101/2893856/Sample-characterization-by-transverse-photothermal?redirectedFrom=fulltext   Language: English Work type: Unknown Typology: 1.02 - Review Article Organization: UNG - University of Nova Gorica Keywords: photothermal techniques, beam deflection spectrometry, material characterization Publication status: Published Publication version: Version of Record Publication date: 01.06.2023 Year of publishing: 2023 Number of pages: str. 1-24 Numbering: Vol. 133, issue 21, [article no.] 211101 PID: 20.500.12556/RUNG-8258-ae8a23b6-da92-8d89-ccf6-e5591cb6cbce  COBISS.SI-ID: 155461891  UDC: 54 ISSN on article: 0021-8979 DOI: 10.1063/5.0148079  NUK URN: URN:SI:UNG:REP:HWOMUO20 Publication date in RUNG: 13.06.2023 Views: 1995 Downloads: 3 Metadata:    Cite this work Plain text BibTeX EndNote XML EndNote/Refer RIS ABNT ACM Ref AMA APA Chicago 17th Author-Date Harvard IEEE ISO 690 MLA Vancouver : Copy citation

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Record is a part of a journal

Title:	Journal of applied physics
Shortened title:	J. appl. phys.
Publisher:	American Institute of Physics.
ISSN:	0021-8979
COBISS.SI-ID:	4730378

Document is financed by a project

Funder:	ARIS - Slovenian Research and Innovation Agency
Project number:	P2-0393
Name:	Napredni materiali za nizkoogljično in trajnostno družbo

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