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1. Spectroscopic Photo-IV Diagnostics of Nitride-based HEMT on Si Wafers D.A. Ewoldt, Guofu Niu, Michael Hamilton, Ayayi Ahyi, Ozden Burcu, M Goforth, Chunkun Jiao, Min Khanal, Chunwei Yang, Kosala Yapabandara, Fei Tong, G Chung, Minseo Park, 2013, original scientific article Found in: osebi Keywords: Spectroscopic Photo-IV, AlGaN/GaN HEMT Published: 16.01.2017; Views: 3501; Downloads: 0 Fulltext (179,21 KB)

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