Your browser does not allow JavaScript!
JavaScript is necessary for the proper functioning of this website. Please enable JavaScript or use a modern browser.
University of Nova Gorica
University
Study
Research
Repository of University of Nova Gorica
About
Search
Browse
Statistics
Login
Show document
A+
|
A-
|
|
SLO
|
ENG
Title:
Latest technologies in beam diagnostics-HW
Authors:
ID
Repič, Borut
(Author)
Files:
http://www.i-tech.si/file/download/168_d2425cec5cdd
Language:
English
Work type:
Not categorized
Typology:
1.12 - Published Scientific Conference Contribution Abstract
Organization:
UNG - University of Nova Gorica
Keywords:
strojna oprema
,
modularne rešitve
,
diagnostika žarkov
Year of publishing:
2011
Number of pages:
9 prosojnic
PID:
20.500.12556/RUNG-1193
COBISS.SI-ID:
2034683
UDC:
621.384.6
NUK URN:
URN:SI:UNG:REP:LZXWPH2I
Publication date in RUNG:
15.10.2013
Views:
11062
Downloads:
36
Metadata:
Cite this work
Plain text
BibTeX
EndNote XML
EndNote/Refer
RIS
ABNT
ACM Ref
AMA
APA
Chicago 17th Author-Date
Harvard
IEEE
ISO 690
MLA
Vancouver
:
REPIČ, Borut, 2011, Latest technologies in beam diagnostics-HW. In : [online]. Published Scientific Conference Contribution Abstract. 2011. [Accessed 1 April 2025]. Retrieved from: http://www.i-tech.si/file/download/168_d2425cec5cdd
Copy citation
Average score:
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
(0 votes)
Your score:
Voting is allowed only for
logged in
users.
Share:
Similar works from our repository:
Characterization of organic semiconductor thin layers by transient photocurrent spectroscopy
Električna prevodnost v 3,4,9,10 perilendianhidrid tetrakarboksilni kislini (PTCDA)
Ultraviolet absorption and transient photocurrent spectroscopy in organic thin layers as evidence of super atomic molecular orbitals in corannulene
MORFOLOŠKA ODVISNOST POVRŠINE NANOSTRUKTURIRANIH POLPREVODNIKOV OD PARAMETROV RASTI
Characterisation of charge carrier transport in thin organic semiconductor layers by time-of-flight photocurrent measurements
Similar works from other repositories:
Schottkyjeva bariera
Preučevanje izolativne CuN monoplasti z STM mikroskopijo
Sistem za karakterizacijo organskih solarnih celic na osnovi fotonapetostne spektroskopije
Določanje benzopiran-2-ominov in N-kloro-benzopiran-2iminov s tekočinsko kromatografijo
SPECTROSCOPIC TERAHERTZ IMAGING
Hover the mouse pointer over a document title to show the abstract or click on the title to get all document metadata.
Back