| Title: | Scanning Photoelectron Spectro‐Microscopy: A Modern Tool for the Study of Materials at the Nanoscale |
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| Authors: | Zeller, Patrick (Author)
Amati, Matteo (Author)
Sezen, Hikmet (Author)
Scardamaglia, Mattia (Author)
Struzzi, Claudia (Author)
Bittencourt, Carla (Author)
Lantz, Gabriel (Author)
Hajlaoui, Mahdi (Author)
Papalazarou, Evangelos (Author)
Marsi, Marino (Author)
Fanetti, Mattia (Author)
Ambrosini, Stefano (Author)
Rubini, Silvia (Author)
Gregoratti, Luca (Author) |
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| Files: | This document has no files. This document may have a phisical copy in the library of the organization, check the status via COBISS.  |
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| Language: | English |
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| Work type: | Not categorized (r6) |
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| Tipology: | 1.02 - Review Article |
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| Organization: | UNG - University of Nova Gorica |
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| Keywords: | Scanning photoemission microscopy, graphene, GaAs, nanowires, Fermi Level, Mott-Hubbard transition |
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| Year of publishing: | 2018 |
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| Number of pages: | 8 |
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| Numbering: | 2018 |
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| COBISS_ID: | 5279483 |
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| URN: | URN:SI:UNG:REP:NKGS7OVA |
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| DOI: | 10.1002/pssa.201800308 |
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| Views: | 2759 |
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| Downloads: | 0 |
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| Metadata: |     |
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| Categories: | Document is not linked to any category. |
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