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Title:High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development
Authors:Rösner, Benedikt (Author)
Döring, Florian (Author)
Rebernik Ribič, Primož (Author)
Gauthier, David (Author)
Principi, Emiliano (Author)
Masciovecchio, Claudio (Author)
Zangrando, Marco (Author)
Vila-Comamala, Joan (Author)
De Ninno, Giovanni (Author)
David, Christian (Author)
Files:This document has no files. This document may have a phisical copy in the library of the organization, check the status via COBISS. Link is opened in a new window
Language:English
Work type:Not categorized (r6)
Tipology:1.01 - Original Scientific Article
Organization:UNG - University of Nova Gorica
Keywords:free-electron lasers, metrology, polymers, X-ray optics
Year of publishing:2017
Number of pages:str. 30686-30695
Numbering:no. 24, Vol. 25
COBISS_ID:5537531 Link is opened in a new window
UDC:53
ISSN on article:1094-4087
URN:URN:SI:UNG:REP:GD14WOVT
DOI:10.1364/OE.25.030686 Link is opened in a new window
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Title:Optics express
Shortened title:Opt. express
Publisher:Optical Society of America
ISSN:1094-4087
COBISS.SI-ID:8636438 New window

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