| Title: | High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development |
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| Authors: | Rösner, Benedikt (Author)
Döring, Florian (Author)
Rebernik Ribič, Primož (Author)
Gauthier, David (Author)
Principi, Emiliano (Author)
Masciovecchio, Claudio (Author)
Zangrando, Marco (Author)
Vila-Comamala, Joan (Author)
De Ninno, Giovanni (Author)
David, Christian (Author) |
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| Files: | This document has no files. This document may have a phisical copy in the library of the organization, check the status via COBISS.  |
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| Language: | English |
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| Work type: | Not categorized (r6) |
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| Tipology: | 1.01 - Original Scientific Article |
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| Organization: | UNG - University of Nova Gorica |
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| Keywords: | free-electron lasers, metrology, polymers, X-ray optics |
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| Year of publishing: | 2017 |
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| Number of pages: | str. 30686-30695 |
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| Numbering: | no. 24, Vol. 25 |
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| COBISS_ID: | 5537531 |
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| UDC: | 53 |
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| ISSN on article: | 1094-4087 |
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| URN: | URN:SI:UNG:REP:GD14WOVT |
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| DOI: | 10.1364/OE.25.030686 |
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| Views: | 2200 |
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| Downloads: | 0 |
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| Metadata: |     |
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| Categories: | Document is not linked to any category. |
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