| Title: | High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development |
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| Authors: | ID Rosner, Benedikt (Author)
ID Döring, Florian (Author)
ID Rebernik Ribič, Primož (Author)
ID Gauthier, David (Author)
ID Principi, Emiliano (Author)
ID Masciovecchio, Claudio (Author)
ID Zangrando, Marco (Author)
ID Vila-Comamala, Joan (Author)
ID De Ninno, Giovanni (Author)
ID David, Christian (Author) |
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| Files: |
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| Language: | English |
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| Work type: | Not categorized |
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| Typology: | 1.01 - Original Scientific Article |
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| Organization: | UNG - University of Nova Gorica
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| Keywords: | free-electron lasers, metrology, polymers, X-ray optics |
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| Year of publishing: | 2017 |
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| Number of pages: | str. 30686-30695 |
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| Numbering: | Vol. 25, no. 24 |
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| PID: | 20.500.12556/RUNG-4964-a44c54ed-fc2f-c8c7-8186-65a8120bf42b |
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| COBISS.SI-ID: | 5537531 |
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| UDC: | 53 |
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| ISSN on article: | 1094-4087 |
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| DOI: | 10.1364/OE.25.030686 |
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| NUK URN: | URN:SI:UNG:REP:GD14WOVT |
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| Publication date in RUNG: | 13.01.2020 |
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| Views: | 3864 |
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| Downloads: | 0 |
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