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Title:Characterization of organic semiconductor thin layers by transient photocurrent spectroscopy
Authors:ID Pastukhova, Nadiia (Author)
ID Pavlica, Egon (Author)
ID Bratina, Gvido (Author)
Files: This document has no files that are freely available to the public. This document may have a physical copy in the library of the organization, check the status via COBISS. Link is opened in a new window
Language:English
Work type:Unknown
Typology:1.12 - Published Scientific Conference Contribution Abstract
Organization:UNG - University of Nova Gorica
Keywords:organic semiconductors, thin layers, spectroscopy
Year of publishing:2019
Number of pages:Str. 48
PID:20.500.12556/RUNG-5019-44239983-dd13-8e42-c2b0-284266dcd1b9 New window
COBISS.SI-ID:5563131 New window
UDC:53
NUK URN:URN:SI:UNG:REP:2ETQMTKC
Publication date in RUNG:10.02.2020
Views:4417
Downloads:0
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:
PASTUKHOVA, Nadiia, PAVLICA, Egon and BRATINA, Gvido, 2019, Characterization of organic semiconductor thin layers by transient photocurrent spectroscopy. In : Innovation in materials science & technology [online]. Published Scientific Conference Contribution Abstract. Washington. 2019. [Accessed 2 April 2025]. Retrieved from: https://repozitorij.ung.si/IzpisGradiva.php?lang=eng&id=5019
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Record is a part of a monograph

Title:Innovation in materials science & technology
Place of publishing:Washington
Publisher:American Chemical Society
Year of publishing:2019
COBISS.SI-ID:5562875 New window

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