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Title:Fractal and fingerprint analysis through phase embedded diffraction pattern
Authors:Mohanachandran Nair Sindhu, Swapna (Author)
et al.
Files:This document has no files. This document may have a phisical copy in the library of the organization, check the status via COBISS. Link is opened in a new window
Language:English
Work type:Not categorized (r6)
Tipology:1.01 - Original Scientific Article
Organization:UNG - University of Nova Gorica
Abstract:Fingerprint recognition is the most popular biometric identification method currently employed in security applications. Though there are several optical methods for fingerprint analysis based on intensity recording, phase recording alone can give the precise result. Interference and diffraction phenomenon are capable of recording phase variations. In the present method diffraction patterns corresponding to the fingerprints are generated and the spacing between the ridges is calculated. The spacing between ridges is found to be in agreement with the value measured using the software ImageJ. The fingerprint impressions of more than thirty-five persons are recorded and analyzed using the statistical tools in Matlab.The fingerprints are also subjected to fractal analysis. The program could successfully identify a fingerprint from the database. The present work is the first report of fingerprint analysis from diffraction pattern
Keywords:Diffraction, Skew, Kurtosis, Fractals
Year of publishing:2017
Number of pages:5
Numbering:8, 9
COBISS_ID:113397251 Link is opened in a new window
URN:URN:SI:UNG:REP:HJVYF8WF
License:CC BY-NC-ND 4.0
This work is available under this license: Creative Commons Attribution Non-Commercial No Derivatives 4.0 International
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Record is a part of a journal

Title:International Journal of Engineering Science and Technology
ISSN:0975-5462
Year of publishing:2017

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