Title: | Fractal and fingerprint analysis through phase embedded diffraction pattern |
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Authors: | Mohanachandran Nair Sindhu, Swapna (Author) et al. |
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Files: | This document has no files. This document may have a phisical copy in the library of the organization, check the status via COBISS.  |
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Language: | English |
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Work type: | Not categorized (r6) |
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Tipology: | 1.01 - Original Scientific Article |
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Organization: | UNG - University of Nova Gorica |
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Abstract: | Fingerprint recognition is the most popular biometric identification method currently employed
in security applications. Though there are several optical methods for fingerprint analysis based on
intensity recording, phase recording alone can give the precise result. Interference and diffraction
phenomenon are capable of recording phase variations. In the present method diffraction patterns
corresponding to the fingerprints are generated and the spacing between the ridges is calculated. The
spacing between ridges is found to be in agreement with the value measured using the software ImageJ.
The fingerprint impressions of more than thirty-five persons are recorded and analyzed using the
statistical tools in Matlab.The fingerprints are also subjected to fractal analysis. The program could
successfully identify a fingerprint from the database. The present work is the first report of fingerprint
analysis from diffraction pattern |
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Keywords: | Diffraction, Skew, Kurtosis, Fractals |
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Year of publishing: | 2017 |
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Number of pages: | 5 |
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Numbering: | 8, 9 |
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COBISS_ID: | 113397251  |
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URN: | URN:SI:UNG:REP:HJVYF8WF |
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License: |  This work is available under this license: Creative Commons Attribution Non-Commercial No Derivatives 4.0 International |
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Views: | 346 |
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Downloads: | 0 |
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