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Evolution of fractal dimension in pulsed laser deposited MoO3 film with ablation time and annealing temperature
Mohanachandran Nair Sindhu, Swapna
, UNIVERSITY OF KERALA (Author), et al.
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1.01 - Original Scientific Article
UNG - University of Nova Gorica
The multifractal analysis is a potential method for assessing thin flm surface morphology and its changes due to diferent deposition conditions and post-deposition treatments. In this work, the multifractal analysis is carried out to understand the surface morphology—root mean square (RMS) surface roughness—of nanostructured MoO3 flms prepared by pulsed laser deposition technique by varying the ablation time and post-deposition annealing. The XRD analysis shows the evolution of crystalline nature with annealing temperature. The XRD pattern of all the annealed flms shows the characteristic peak of the orthorhombic MoO3 phase. The FESEM and AFM analysis reveals the morphological modifcation with ablation time and annealing temperature. The multifractal analysis of the AFM images shows that the box—counting, information and correlation dimension varies with the annealing temperature. The study also reveals the inverse relation between the fractal dimension and the RMS surface roughness due to the annealing induced particle size variation and reorientation. The fractal dimension’s evolution in the pulsed laser deposited MoO3 flm with ablation time and annealing temperature is also investigated. Thus, the study reveals the potential of multifractal analysis in the thin flm surface characterizatio
Multifractal analysis · Pulsed laser deposition · Molybdenum oxide · Atomic force microscopy · Fractal
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Applied Physics A
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