SWAPNA, Mohanachandran Nair Sindhu, 2020, Criticality of depth of intensity modulation and simulation of refractive index profile in thermal lens technique. The European Physical Journal of Applied Physics [online]. 2020. Vol. 1, no. 90. [Accessed 23 April 2025]. DOI https://doi.org/10.1051/epjap/2020200024. Retrieved from: https://repozitorij.ung.si/IzpisGradiva.php?lang=eng&id=7487