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Title:High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development
Authors:ID Rösner, Benedikt (Author)
ID Döring, Florian (Author)
ID Rebernik Ribič, Primož (Author)
ID Gauthier, David (Author)
ID Principi, Emiliano (Author)
ID Masciovecchio, Claudio (Author)
ID Zangrando, Marco (Author)
ID Vila-Comamala, Joan (Author)
ID De Ninno, Giovanni (Author)
ID David, Christian (Author)
Files: This document has no files. This document may have a physical copy in the library of the organization, check the status via COBISS. Link is opened in a new window
Language:English
Work type:Not categorized
Typology:1.01 - Original Scientific Article
Organization:UNG - University of Nova Gorica
Keywords:free-electron lasers, metrology, polymers, X-ray optics
Year of publishing:2017
Number of pages:str. 30686-30695
Numbering:Vol. 25, no. 24
PID:20.500.12556/RUNG-4964-a44c54ed-fc2f-c8c7-8186-65a8120bf42b New window
COBISS.SI-ID:5537531 New window
UDC:53
ISSN on article:1094-4087
DOI:10.1364/OE.25.030686 New window
NUK URN:URN:SI:UNG:REP:GD14WOVT
Publication date in RUNG:13.01.2020
Views:2947
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Record is a part of a journal

Title:Optics express
Shortened title:Opt. express
Publisher:Optical Society of America
ISSN:1094-4087
COBISS.SI-ID:8636438 New window

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