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Title:Fractal analysis as a potential tool for surface morphology of thin films
Authors:ID Swapna, Mohanachandran Nair Sindhu, UNIVERSITY OF KERALA (Author), et al.
Files: This document has no files that are freely available to the public. This document may have a physical copy in the library of the organization, check the status via COBISS. Link is opened in a new window
Language:English
Work type:Not categorized
Typology:1.01 - Original Scientific Article
Organization:UNG - University of Nova Gorica
Keywords:Fractals.thin film, AFM, surface morphology
Year of publishing:2017
Number of pages:2017
Numbering:12, 132
PID:20.500.12556/RUNG-7483 New window
COBISS.SI-ID:113880067 New window
DOI:10.1140/epjp/i2017-11826-8 New window
NUK URN:URN:SI:UNG:REP:8IDCRC1V
Publication date in RUNG:05.07.2022
Views:1357
Downloads:0
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Record is a part of a journal

Title:The European Physical Journal Plus
Year of publishing:2017

Licences

License:CC BY-NC-ND 4.0, Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International
Link:http://creativecommons.org/licenses/by-nc-nd/4.0/
Description:The most restrictive Creative Commons license. This only allows people to download and share the work for no commercial gain and for no other purposes.
Licensing start date:05.07.2022

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