Show document

A+ | A- | SLO | ENG

Title: Nondestructive Evaluation of Surface Roughness of Thin Films through Fractal Analysis, S Soumya Authors: Mohanachandran Nair Sindhu, Swapna (Author) et al. Files: This document has no files. This document may have a phisical copy in the library of the organization, check the status via COBISS.  Language: English Work type: Not categorized (r6) Tipology: 1.01 - Original Scientific Article Organization: UNG - University of Nova Gorica Keywords: Nondestructive Evaluation, Surface Roughness, Thin Films, Fractal Analysis Year of publishing: 2017 Number of pages: 6 Numbering: 11, 3 COBISS_ID: 113934083  URN: URN:SI:UNG:REP:NVRAMLFQ License: This work is available under this license: Creative Commons Attribution Non-Commercial No Derivatives 4.0 International Views: 459 Downloads: 0 Metadata:     Categories: Document is not linked to any category. Cite this work Plain text BibTeX EndNote XML EndNote/Refer RIS ABNT ACM Ref AMA APA Chicago Harvard IEEE ISO 690 MLA Vancouver :

Average score: (0 votes) Your score: Voting is allowed only for logged in users. Hover the mouse pointer over a document title to show the abstract or click on the title to get all document metadata.

Record is a part of a journal

Title:	International Journal of Nanotechnology and Applications
Year of publishing:	2017

Back